Advances in technology allow the design and fabrication of increasingly complex devices, consisting of multiple processor cores, ASIC blocks, memory, analog circuitry, etc. Much of this complex functionality is not directly accessible from outside any more and thus cannot easily be tested using traditional test technologies. In this project we investigate new and improved mechanisms and schemes to allow the debugging and testing of current and future complex devices. One special focus is the test of asynchronous circuits.
Having in-house test capabilities available allows tight integration and close cooperation between design, technology and test teams. Results from the research part of the project can also be evaluated in practice.