IHP offers support for yield enhancement through failure mode analysis with state-of-the-art equipment, including AES, AFM, FIB, LST, SEM, SIMS, STM and TEM. Tester and equipment for RF measurements are available.
IHP offers support for yield enhancement through failure mode analysis with state-of-the-art equipment, including AES, AFM, FIB, LST, SEM, SIMS, STM and TEM. Tester and equipment for RF measurements are available.