Objective
Prototype characterization of IHP- and custom designs fabricated in IHP‘s pilot line, Radiation hardness testing of prototype devices for aerospace applications.
Mixed Signal and Radiation Hardness Testing of Prototype Devices
Methods
- Chip testing with analog and digital test signals on wafer and at packaged devices
- Bit error rate testing (BERT) up to 32 Gb/s
- Total Ionization Dose testing with IHP's test set up for device biasing, Co-60 g-source with doses up to several Mrad using irradiation facilities of Helmholtz Zentrum Berlin (HCB), Single Even Effects testing with IHP's test set up based on FPGAs and NI PXI system, LET (local energy transfer) up to 67.7 cm2/mg using irradiation facilities of UCL Belgium and RADEF Finnland
Equipment
- PXI-System with flexible modular instrumentation architecture, rugged PC-based high-performance mixed signal measurement system
- Agilent BERT system: pseudorandom binary sequence generator (PRBS), 70 GHz sampling oscilloscope: Agilent Infiniium DCA-X 86100D, Pattern Generator: Agilent N4951B, Serial BERT: Agilent N4960A
