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QLO – Long Term Stress Tests

Lifetime assessment under HCI degradation at room temperature of active devices in SGB25RH PDK


To verify the relationship between DC and dynamic degradation of CMOS and HBT devices due to HCI at room temperature and extrapolate lifetime under dynamic regime.

IHP's Contribution

  • Design and Development of Dynamic Evaluation Circuit (DEC) Test Vehicle
  • Performing Dynamic Long Term Stress Tests (+2000 hours)
  • Test Data Analysis


This project has received funding from DLR-RFM under Contract Nº 50PS0705.

Project Partners

  • OHB  GmbH (ex Kayser-Threde), Germany (Prime Contractor/Coordinator)
  • Micross Components (UK)
The building and the infrastructure of the IHP were funded by the European Regional Development Fund of the European Union, funds of the Federal Government and also funds of the Federal State of Brandenburg.